The award-winning LumiSolarCell System utilizes the photoluminescence, electroluminescence, and infrared phenomena to image micro cracks, shunts, regions of low lifetime, inhomogeneities, hot spots or other cell failures of photovoltaic cells or wafers. EL, PL and IR as contactless and therefore non-destructive methods are an indispensable tool for advanced solar research. In addition to that, the series resistance (Rs) can be measured by an algorithm which compares EL images taken under low and high current conditions.
The knowledge gained will lead to increased product quality and yield.
Due to the outstanding sensitivity of the whole set-up, multiple PV technologies such as Si-based cells and wafers as well as thin film mini modules can be measured. LumiSolarCell is delivered as a turnkey system and consists of a highly-sensitive scientific CCD-camera and a HighPower LED light source, developed and produced by greateyes. Different versions of the system are available (off-line, automated batch system, OEM in-line, pure PL or EL, combined EL/PL, or EL/PL/IR/Rs). Furthermore the LumiSolarCell system outperforms commercial available PL systems with very short exposure times by using a high-sensitive CCD-camera and the flexibility to measure a variety of different wafer materials, such as mono-Si, a-Si, CIS, HIT and many more.
- Inspection of wafer and solar cells
- Combined EL/PL/IR/Rs system in a compact table top device
- Unique, award-winning HighPower LED light source
Model Specification LumiSolarCell PL
|Characterisation methods||Photoluminescence: PL imaging, biased PL | Minority carrier lifetime mapping|
|Dimensions of housing||715mm x 600mm x 1120mm|
|Inspection capabilities||Micro-cracks identification | Paste properties | Local lifetime | Dead cells | Broken cells | Inhomogeneities and impurities|
|Areas of application||Inspection of wafers, processed solar cells and thin film substrates | Research and development | Characterization and qualification | Failure analysis | Identification/sorting of wafers & cells|
|Successfully tested on various solar cell types||Monocrystalline silicon (mono-Si) | Polycrystalline silicon (poly-Si) | Amorphous silicon (a-Si) | Copper indium sulfide (CIS) | Copper indium gallium selenide (CIGS) | Cadmium telluride (CdTe) | Heterojunction with intrinsic thin layer (HIT)|
|Advantages of the system||Non-contacting characterization through PL measurement | Unique, award-winning HighPower LED light source | Outstanding image quality | No limiting safety requirements in contrast to laser-based PL systems | Industry proven all over the globe | Cost over performance | Scalable set-up|
|Power supply input||100-240V, 50/60Hz|
|Typ. exposure times||0.1sec-10sec depending on the substrate and type of measurement|
|PL light source||HighPower LED array | Adjustable intensity, max. 1500W/m² (>1 Sun) | Homogeneity >90%|
|Image size||1024 × 1024 pixel, 16 bit or 2048 × 2048 pixel, 16 bit|
|Image resolution||150 µm or 80 µm/pixel|
|Substrate size||200 mm x 200 mm|
|Functionalities||PL, biased PL|
LumiSolarCell SoftwareThe LumiSolarCell software controls the camera and visualizes the data sets. The program can generate intensity profiles from the 16bit high dynamic range image data. Basic picture manipulation procedures are included in the software. Dimension measurements of artefacts are possible following calibration as well as remote control of power supply and high power LED light source.
|System requirements||Windows XP / Vista / 7 / 10
USB 2.0 Interfaces
|General functions||Single shot, videomode
load & save images, quicksave
|Image data formats||BMP, JPEG, TIFF, Raw data, TXT|
|Visualisation||Gray scale or false-color
Linear / logarithmic scaling
|Special functions||Distance measurements
Remote control of power supply
Automatic background substraction