Photoluminescence (PL) method

 

The solar cell or wafer is excited by a high-intensity light source. No electrical connections to the solar cell are necessary. The invisible photoluminescence radiation emitted by the wafer or solar cell is detected by a highly sensitive camera.

The photoluminescence as contactless measurement method is especially qualified for the inspection at an early stage of production and development. It enables the inspection of as-cut wafer, processed wafer and solar cells.  An overview of our high-performance optical inspection systems can be found here.
 

Examples