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greateyes GmbH
Ludwig-Boltzmann-Str. 3
12489 Berlin

+49 (0)30 221 844 700
+49 (0)30 221 844 709
info    greateyes.de

The award-winning LumiSolarCell System utilizes the photoluminescence, electroluminescence, and infrared phenomena to image micro cracks, shunts, regions of low lifetime, inhomogeneities, hot spots or other cell failures of photovoltaic cells or wafers. EL, PL and IR as contactless and therefore non-destructive methods are an indispensable tool for advanced solar research. In addition to that, the series resistance (Rs) can be measured by an algorithm which compares EL images taken under low and high current conditions. The knowledge gained will lead to increased product quality and yield.

Due to the outstanding sensitivity of the whole set-up, multiple PV technologies such as Si-based cells and wafers as well as thin film mini modules can be measured. LumiSolarCell is delivered as a turnkey system and consists of a highly-sensitive scientific CCD-camera and a HighPower LED light source, developed and produced by greateyes. Different versions of the system are available (off-line, automated batch system, OEM in-line, pure PL or EL, combined EL/PL, or EL/PL/IR/Rs). Furthermore the LumiSolarCell system outperforms commercial available PL systems with very short exposure times by using a high-sensitive CCD-camera and the flexibility to measure a variety of different wafer materials, such as mono-Si, a-Si, CIS, HIT and many more.

  • Inspection of wafer and solar cells
  • Combined EL/PL/IR/Rs system in a compact table top device
  • Unique, award-winning HighPower LED light source

LumiSolarCell EL PL

Model Specification LumiSolarCell EL PL

Characterisation methods Electroluminescence: EL and reverse-biased EL imaging, measurement of the local cell voltage, mapping of the local current densitiy, series resistance
Photoluminescence: PL imaging, biased PL, minority carrier lifetime mapping
Weight 75 kg
Dimensions of housing 715mm x 600mm x 1120mm
Inspection capabilities Micro-cracks identification | Shunt detection | Finger defects | Paste properties | Local lifetime | Dead cells | Broken cells | Inhomogeneities and impurities
Areas of application Inspection of wafers, processed solar cells and thin film substrates | Research and development | Characterization and qualification | Failure analysis | Identification/sorting of wafers & cells
Successfully tested on various solar cell types Monocrystalline silicon (mono-Si) | Polycrystalline silicon (poly-Si) | Amorphous silicon (a-Si) | Copper indium sulfide (CIS) | Copper indium gallium selenide (CIGS) | Cadmium telluride (CdTe) | Heterojunction with intrinsic thin layer (HIT)
Advantages of the system Non-contacting characterization through PL measurement | Unique, award-winning HighPower LED light source | Combined EL/PL tool in one set-up | Outstanding image quality | No limiting safety requirements in contrast to laser-based PL systems | Industry proven all over the globe | Cost over performance | Scalable set-up
Power supply input 100-240V, 50/60Hz
Typ. exposure times 0.1sec-10sec depending on the substrate and type of measurement
EL excitation source Programmable power supply, 0-80V, 0-9.5A
PL light source HighPower LED array | Adjustable intensity, max. 1500W/m² (>1 Sun) | Homogeneity >90%
EL contacting adapter Adapter for 5 and 6 inch cells (156mm x 156mm) included | Flexible design for 2-5 bus bars | Vacuum contact adapters for IBC cells available as an option
Image size 1024 x 1024 pixel, 16 bit or 2048 x 2048 pixel, 16 bit
Image resolution 150 µm or 80 µm/pixel
Substrate size 200 mm x 200 mm
Functionalities EL, reverse biased EL , PL, biased PL

Data Sheets


LumiSolarCell Software

The LumiSolarCell software controls the camera and visualizes the data sets. The program can generate intensity profiles from the 16bit high dynamic range image data. Basic picture manipulation procedures are included in the software. Dimension measurements of artefacts are possible following calibration as well as remote control of power supply and high power LED light source.


Selected Specifications 
System requirements Windows XP / Vista / 7 / 10
USB 2.0 Interfaces
General functions Single shot, videomode 
load & save images, quicksave
Image data formats BMP, JPEG, TIFF, Raw data, TXT
Visualisation Gray scale or false-color
Zoom functions
Linear / logarithmic scaling
Intensity profiles 
Special functions Distance measurements 
Remote control of power supply
Automatic background substraction