The award-winning LumiSolarCell System utilizes the photoluminescence, electroluminescence, and infrared phenomena to image micro cracks, shunts, regions of low lifetime, inhomogeneities, hot spots or other cell failures of photovoltaic cells or wafers. EL, PL and IR as contactless and therefore non-destructive methods are an indispensable tool for advanced solar research. In addition to that, the series resistance (Rs) can be measured by an algorithm which compares EL images taken under low and high current conditions. The knowledge gained will lead to increased product quality and yield.

Due to the outstanding sensitivity of the whole set-up, multiple PV technologies such as Si-based cells and wafers as well as thin film mini modules can be measured. LumiSolarCell is delivered as a turnkey system and consists of a highly-sensitive scientific CCD-camera and a HighPower LED light source, developed and produced by greateyes. Different versions of the system are available (off-line, automated batch system, OEM in-line, pure PL or EL, combined EL/PL, or EL/PL/IR/Rs). Furthermore the LumiSolarCell system outperforms commercial available PL systems with very short exposure times by using a high-sensitive CCD-camera and the flexibility to measure a variety of different wafer materials, such as mono-Si, a-Si, CIS, HIT and many more.