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Electroluminescence and Photoluminescence Inspection of Solar Cells & Modules
Solar Cells and Solar Modules suffer from a variety of invisible defects which reduce their output power and long-term stability. The highly sensitive Inspection Systems from greateyes image these problems. This allows you to optimize the production, increase output power and reduce overall costs.
Advantages of Electroluminescence (EL) and Photoluminescence (PL) Inspection
- EL and PL are non-destructive methods
- Measurements deliver detailed information about defects and their location
- EL and PL provide a high informative content, many types of defects can be clearly identified
- Fast measurement on a second timescale
- EL can be used to investigate small cells as well as large areas made from mono-Si, poly-Si, a-Si, micro-Si, CIGS, CIS, CdTe
- Method can be integrated in the production process (in-line)
- EL and PL are also well suited for research and development of new photovoltaic devices
Differences between Electroluminescence (EL) and Photoluminescence (PL) Inspection
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Electroluminescence |
Photoluminescence |
| Requirements |
Electrical contacts are necessary. |
No electrical contacts needed. |
| Substrates |
Solar Cells, Strings, Modules |
Wafers, Solar Cells |
| Materials |
mono-Si, poly-Si, a-Si, micro-Si, CIGS, CIS, CdTe |
mono-Si, poly-Si |
| Measurement time |
>0.5-1sec for mono-Si or poly-Si |
>1sec for mono-Si, poly-Si |
| Informative Value |
Cracks, Shunts, Finger defects, Deposition problems, bad edge isolation, ... |
similiar to EL, problems of the electrical grid system typically not visible |
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greateyes GmbH
Rudower Chaussee 29
12489 Berlin
rooms: A619-A633
phone.: +49 (0)30 6392 6237
fax: +49 (0)30 6392 6238
Fast Request Form
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